We have developed a new depth-graded multilayer system comprising W and SiC layers, suitable for use as hard x-ray reflective coatings operating in the energy range 100 -200 keV. Grazing-incidence x-ray reflectance at E ϭ 8 keV was used to characterize the interface widths, as well as the temporal and thermal stability in both periodic and depth-graded W͞SiC structures, whereas synchrotron radiation was used to measure the hard x-ray reflectance of a depth-graded multilayer designed specifically for use in the range Eϳ150 -170 keV. We have modeled the hard x-ray reflectance using newly derived optical constants, which we determined from reflectance versus incidence angle measurements also made using synchrotron radiation, in the range E ϭ 120 -180 keV. We describe our experimental investigation in detail, compare the new W͞SiC multilayers with both W͞Si and W͞B 4 C films that have been studied previously, and discuss the significance of these results with regard to the eventual development of a hard x-ray nuclear line telescope.