Structural, electrical, and optical properties of transparent conductive oxide ZnO:Al films prepared by dc magnetron reactive sputtering Optical and electrical properties of sputter-deposited FeSi 2 thin films on p-Si͑100͒ and SiO 2 / p-Si͑100͒ substrates as well as their evolution with rapid thermal annealing ͑RTA͒ temperature have been investigated. Optical absorption measurements were carried out to determine the absorption spectra of FeSi 2 based on the proposed optical absorption model for the double-layer and triple-layer structures. A direct band gap behavior was concluded for both amorphous and polycrystalline semiconducting FeSi 2 . An absorption coefficient in the order of 10 5 cm −1 at 1 eV and a band gap value of ϳ0.86 eV were obtained for the -FeSi 2 . Hall effect measurements at room temperature indicate heavily doped and n-type conductivity for the FeSi 2 films on p-Si, whose residual carrier concentration was found to be closely correlated with the observed subgap optical absorption via band tailing. The carrier mobility was shown to increase with decreasing residual carrier concentration when the RTA temperature was increased.