Growth of thin zirconium and zirconium oxides films on the n-GaN(0001) surface studied by XPS and LEED

Bacterial adhesion on amorphous and crystalline metal oxide coatings

“…This data corroborated that the oxide films have the elemental composition corresponding to the stoichiometry of the most stable oxides of Ti and Zr, i.e. TiO 2 and ZrO 2 , respectively [39,40,43,44]. No presence of substoichiometric oxides was observed; Ti or Zr was present in the films only as oxidized species in their maximum valence state, Ti 4+ at ≈458.8 eV and Zr 4+ at ≈184.6 eV, respectively.…”