Abstract:Peculiarities of depth profiling of PbTe crystals by Ar plasma with energy of 350 eV at the conditions of Secondary Neutral Mass Spectrometry originated from the crystal growth environment are presented. The crystals grown from vapor phase and from melt by the Bridgman method were studied. The natural faceted surface corresponding to the crystallographic plane of high symmetry (100), the natural lateral surfaces of crystal ingots, and the surfaces processed mechanically during cutting of the crystals were prof… Show more
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