Silicon nanowires (Si NWs) represent an attractive class of building blocks for nanoelectronics and sensors. However, for many applications, the presence of oxide on the Si NW surface is undesirable, because a defective oxide layer (e.g., native SiO 2 ) induces uncontrolled interface states in the band gap of the Si.Freshly prepared H-terminated Si NWs have low surface recombination velocities but are not stable in air for more than a few hours, because disordered oxide layers form.1 Recently, we have reported on Si NWs that were chemically modified by CH 3 functionalities through a covalent Si-C bond.2 The resulting CH 3 -Si NWs allowed formation of air-stable Si NW Field Effect Transistors (FETs) having on-off ratios in excess of 10 5 over a relatively small gate voltage swing ((2 V).2 Though CH 3 termination gives full coverage of the Si atop sites, 3 subsequent functionalization is not possible. The ability to attach a controlled functionality to a stable, fully passivated Si NW is highly desirable for a wide range of applications, especially for biosensors and systematic control over the electrical properties of Si NWs.Here, we report on Si NWs modified by covalent CH 3 s CHdCHs scaffolds, via SisC bonds, that give nearly full coverage of the Si atop sites and, at the same time, provide a route for subsequent functionalization. The obtained CH 3 sCHdCHsSi NWs exhibit superior oxidation resistance over Si NWs that are modified with CH 3 s or CH 3 sCtCs functionalities, which give nearly full coverage of the Si atop site too.The Si NWs investigated here were composed of 50 ( 10 nm diameter Si cores coated with 3-4 nm native SiO 2 skins (see Supporting Information, Figure 1S) and contained pronounced low index facets, such as (111), (100), and (112). 4 These Si NWs were terminated with methyl (CH 3 s), propenyl (CH 3 sCHdCHs), and propynyl (CH 3 sCtCs) functionalities using a chlorination/ alkylation route, 5 as described in section 2 of the Supporting Information. The obtained samples were characterized by high resolution X-ray photo electron spectroscopy (XPS); see Supporting Information, section 3.1. The measurements were done three times for each sample, and averages have been taken. Figure 2S of the Supporting Information shows an XPS scan of Si2p and C1s regions of propenyl-terminated Si NWs. The Si2p spectrum shows Si2p 3/2 and Si2p 1/2 in the expected 2:1 area ratio. No oxidized Si between 101.0 and 103.5 eV was observed (see Supporting Information, Figure 2SA). Three peaks were observed in the C1s region (see Supporting Information, Figure 2SB): (i) a peak at 284.0 eV for carbon atoms covalently bonded to silicon (C-Si); 5 (ii) a peak at 285.0 eV for carbons bonded to either hydrogen or another carbon atoms; and (iii) a peak at 286.6 eV for adventitious carbons bonded to oxygen from the wet chemical processing with THF and/or methanol rinse after functionalization. All the C1s and Si2p peaks mentioned were also observed for methyl-and propynyl-terminated Si NWs. The peak area ratio of the C-Si to the ...