We present a method for the formation of an epitaxial surface layer involving B, N, and Si atoms on a ZrB 2 (0001) thin film on Si(111). It has the potential to be an insulating growth template for 2D semiconductors. The chemical reaction of NH 3 molecules with the silicene-terminated ZrB 2 surface was characterized by synchrotron-based, high-resolution core-level photoelectron spectroscopy and low-energy electron diffraction. In particular, the dissociative chemisorption of NH 3 at 400• C leads to surface nitridation, and subsequent annealing up to 830• C results in a solid phase reaction with the ZrB 2 subsurface layers. In this way, a new nitride-based epitaxial surface layer is formed with hexagonal symmetry and a single in-plane crystal orientation. C 2016 AIP Publishing LLC. [http://dx