2003
DOI: 10.1016/s0169-4332(03)00466-5
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Growth of GaN on ZrB2 substrate by metal-organic vapor phase epitaxy

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Cited by 37 publications
(31 citation statements)
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“…• C has been reported by Tomida et al 18 Formation of a cubic phase Zr x B y N z alloy at temperatures as low as 385…”
Section: Resultsmentioning
confidence: 81%
“…• C has been reported by Tomida et al 18 Formation of a cubic phase Zr x B y N z alloy at temperatures as low as 385…”
Section: Resultsmentioning
confidence: 81%
“…During the first $150 s of the experiment the spacing and uniformity of the RHEED streaks remain constant, but the intensity decreases somewhat. Work by other groups [16,17] has shown that a disordered interfacial layer up to several nanometers thickness can be formed during growth of III-N films on ZrB 2 substrates. We believe that the initial evolution of the RHEED pattern is related to formation of such an interfacial layer rather than actual growth of crystalline GaN.…”
Section: Methodsmentioning
confidence: 99%
“…It has been used as a thin film resistor, a diffusion barrier layer in micro devices, hard coating, and so on. It is also expected to be used for a cold electron emitter, a catalyst, or a substrate for growth of epitaxial GaN films [1,2]. The materials of MB 2 compose an AlB 2 -type crystal structure as shown in Fig.…”
Section: Introductionmentioning
confidence: 99%