1990
DOI: 10.1016/s0022-0248(08)80110-8
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Growth of diamond thin films on silicon and TEM observation of the interface

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Cited by 34 publications
(5 citation statements)
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“…The SiC layer always exists between the diamond and the Si substrate 28 . In the case of PS substrate, it is easily carbonized during growth due to its porous structure.…”
Section: Resultsmentioning
confidence: 99%
“…The SiC layer always exists between the diamond and the Si substrate 28 . In the case of PS substrate, it is easily carbonized during growth due to its porous structure.…”
Section: Resultsmentioning
confidence: 99%
“…4 The negative bias enhanced nucleation in microwave plasma CVD has been popularly used for growth of oriented diamond films. Nucleation is considered very important in diamond growth for its influence on growth rate, morphology, and other qualities.…”
Section: Evidence Of the Role Of Positive Bias In Diamond Growth By Hmentioning
confidence: 99%
“…An intermediate amorphous layer of 2 nm on a Si substrate was detected in the EA CVD method, formed probably due to the electron bombardment [85,86]. Belton et al [lo71 have shown by in situ measurements in the H F CVD method that the carbonaceous contamination and the SiO, layer present prior to growth on diamondscratched Si substrates were removed in the first 15 min of growth and then a S i c layer was grown.…”
Section: Early Stages Of Nucleation the Intermediate Layermentioning
confidence: 99%
“…Glass et al [91] reported nucleation densities up to 10" cm-2 on mirror-polished Si wafers in MA CVD. Kobayashi et al [85] have investigated the influence of a positive bias applied to the surface (between 0 and 140 V). In all cases diamond was synthesized in 2 h, with 60 to 140 V applied.…”
Section: Influence Of Synthesis Conditions On the Nucleation Density mentioning
confidence: 99%