Growth of Antiferromagnetic Oxide Thin Films

Valeri, Sergio; Altieri, S.; Luches, Paola

doi:10.1002/9783527630370.ch2

Cited by 6 publications

(10 citation statements)

References 133 publications

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“…Features a-e in the spectrum related to the thermal treatment have been observed in previous literature works related to photoemission from the (1 1 1) face of FeO, featuring a hexagonal packing of surface atoms [37,38]. The bottom spectrum (figure 2(a), dashed line) has been acquired on a thick (about 4 nm) layer of NiO, grown at RT by depositing Ni on Au(0 0 1) in a reactive O 2 atmosphere [39]. The overall lineshape agrees quite well with previous investigations on NiO [40], and it is distinctly different from the lineshape of the spectra acquired during Ni oxidation, indicating that, in our case, a pure Ni oxide phase is not observed on the 3 ML Ni/ Fe surface.…”

Section: Ni Film Oxidationmentioning

confidence: 53%

Electron spectroscopy investigation of the oxidation of ultra-thin films of Ni and Cr on Fe(0 0 1)

Calloni

Berti

Brambilla

et al. 2014

J. Phys.: Condens. Matter

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We investigated the room temperature oxidation of ultra-thin Ni and Cr films grown on Fe(0 0 1). In particular, we characterized the degree of crystallinity and the stoichiometry of the oxide layers and addressed the chemical stability of the interface with the highly reactive Fe substrate by means of low-energy electron diffraction and x-ray and UV photoemission spectroscopy. In the Ni case we detected, upon oxidation, the formation of a Fe(3)O(4) layer covering the Ni oxide, due to the diffusion of Fe cations towards the surface. At high temperature and in ultra-high vacuum conditions, the Ni oxide dissolved and the Fe oxide layer was reduced to FeO. In the Cr case, we observed the formation of a thin Cr(2)O(3) oxide layer, showing a diffraction pattern compatible with a defective γ-Cr(2)O(3) phase. A thicker Cr oxide layer could be produced by oxidizing the sample at 300 °C, at the expense of the incorporation of trace amounts of Fe cations.

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Section: Ni Film Oxidationmentioning

confidence: 53%

Electron spectroscopy investigation of the oxidation of ultra-thin films of Ni and Cr on Fe(0 0 1)

Calloni

Berti

Brambilla

et al. 2014

J. Phys.: Condens. Matter

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“…However, compared to the strain-induced changes in H C , the change in H E is no more than 5%, indicating that the antiferromagnetic anisotropy is more difficult to be tuned than the FM anisotropy in this system, which may be related to a smaller magnetoelastic effect in the CoO 1−δ than that of Co (−9.2 × 10 7 erg/cm 3 ). [23][24][25]…”

Section: Resultsmentioning

confidence: 99%

Room-temperature electric control of exchange bias effect in CoO_{1 – δ}/Co films using Pb(Mg_1/3Nb_2/3)_0.7Ti_0.3O₃ (110) substrates*

Wen

Yang

et al. 2020

Chinese Phys. B

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Significant electric control of exchange bias effect in a simple CoO1–δ /Co system, grown on piezoelectric Pb(Mg1/3Nb2/3)0.7Ti0.3O3 (110) (PMN-PT) substrates, is achieved at room temperature. Obvious changes in both the coercivity field (H C) and the exchange bias field (H E), of 31% and 5%, respectively, have been observed when the electric field is applied to the substrate. While the change of coercivity is related to the enhanced uniaxial anisotropy in the ferromagnetic layer, the change of the exchange bias field can only originate from the spin reorientation in the antiferromagnetic CoO1–δ layer caused by the strain-induced magnetoelastic effect. A large H E/H C > 2, and H E ∼ 110 Oe at room temperature, as well as the low-energy fabrication of this system, make it a practical system for spintronic device applications.

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“…[9], this indicates an increase of ξ F0 , i.e. a decrease of E ex , which may be caused by a degradation of the Cu 41 Ni 59 alloy (possibly by converting Ni to NiO x, which is antiferromagnetic [42]). …”

Section: B Discussion Of the Superconducting Propertiesmentioning

confidence: 99%

Reentrant superconductivity and superconducting critical temperature oscillations in F/S/F trilayers of Cu41Ni59/Nb/Cu41Ni59 grown on cobalt oxide

Zdravkov

Kehrle

Lenk

et al. 2013

Journal of Applied Physics

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Ferromagnet/Superconductor/Ferromagnet (F/S/F) trilayers constitute the core of a superconducting spin valve. The switching effect of the spin valve is based on interference phenomena occurring due to the proximity effect at the S/F interfaces. A remarkable effect is only expected if the core structure exhibits strong critical temperature oscillations, or most favorable, reentrant superconductivity, when the thickness of the ferromagnetic layer is increased. The core structure has to be grown on an antiferromagnetic oxide layer (or such layer to be placed on top) to pin by exchange bias the magnetization-orientation of one of the ferromagnetic layers. In the present paper we demonstrate that this is possible, keeping the superconducting behavior of the core structure undisturbed.

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Growth of Antiferromagnetic Oxide Thin Films

Cited by 6 publications

References 133 publications

Electron spectroscopy investigation of the oxidation of ultra-thin films of Ni and Cr on Fe(0 0 1)

Electron spectroscopy investigation of the oxidation of ultra-thin films of Ni and Cr on Fe(0 0 1)

Room-temperature electric control of exchange bias effect in CoO_{1 – δ}/Co films using Pb(Mg_1/3Nb_2/3)_0.7Ti_0.3O₃ (110) substrates*

Reentrant superconductivity and superconducting critical temperature oscillations in F/S/F trilayers of Cu41Ni59/Nb/Cu41Ni59 grown on cobalt oxide

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Growth of Antiferromagnetic Oxide Thin Films

Cited by 6 publications

References 133 publications

Electron spectroscopy investigation of the oxidation of ultra-thin films of Ni and Cr on Fe(0 0 1)

Electron spectroscopy investigation of the oxidation of ultra-thin films of Ni and Cr on Fe(0 0 1)

Room-temperature electric control of exchange bias effect in CoO1 – δ/Co films using Pb(Mg1/3Nb2/3)0.7Ti0.3O3 (110) substrates*

Reentrant superconductivity and superconducting critical temperature oscillations in F/S/F trilayers of Cu41Ni59/Nb/Cu41Ni59 grown on cobalt oxide

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Room-temperature electric control of exchange bias effect in CoO_{1 – δ}/Co films using Pb(Mg_1/3Nb_2/3)_0.7Ti_0.3O₃ (110) substrates*