1999
DOI: 10.1016/s1350-4495(99)00018-3
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Growth and properties of PbTe films on porous silicon

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Cited by 17 publications
(8 citation statements)
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“…This mosaic nature is responsible for yielding a number of reflections in XRD method. The observed result is in good agreement with earlier investigations [12,14]. Another effect of mosaic structure is to increase the intensity of the reflected beam, which is observed in Xray diffractograms as seen in Fig.…”
Section: Structuresupporting
confidence: 92%
“…This mosaic nature is responsible for yielding a number of reflections in XRD method. The observed result is in good agreement with earlier investigations [12,14]. Another effect of mosaic structure is to increase the intensity of the reflected beam, which is observed in Xray diffractograms as seen in Fig.…”
Section: Structuresupporting
confidence: 92%
“…The IR sensitivities of these materials are similar to that of Cd 1−x Hg x Te, but are easier to grow; more stable and homogeneity problems regarding the chemical composition are much less severe. Lead chalcogenide thin films have been deposited by various techniques, e.g., chemical bath deposition [2,3], chemical vapour deposition [4], electrodeposition [5], molecular beam epitaxy [6], atomic layer epitaxy [7], hot-wall epitaxy [8], vacuum evaporation [9], magnetron sputtering [10], to name a few. Out of these, electrodeposition is a simple and low cost thin film deposition method with several advantages [11].…”
Section: Introductionmentioning
confidence: 99%
“…Furthermore, the use of PS layer as a substrate may provide a key for growing narrow gap semiconductors films such as PbTe [2]. For this purpose, it is necessary to perform a systematic study to find a suitable PS layer that releases the thermal stress and the lattice mismatch between the lead salt films and the silicon bulk.…”
Section: Introductionmentioning
confidence: 99%