2001
DOI: 10.1088/0953-8984/14/1/302
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Growth and magnetotransport study of thin ferromagnetic CrO2films

Abstract: Highly a-axis-textured CrO 2 films have been deposited on Al 2 O 3 (0001) and on isostructural TiO 2 (100) substrates by a chemical vapour deposition technique. For Al 2 O 3 substrates a columnar growth of CrO 2 (010) on an initial Cr 2 O 3 (0001) layer has been found in transmission electron microscopy as well as in x-ray diffraction investigations. The sixfold in-plane symmetry of a (0001)-oriented Cr 2 O 3 initial layer leads to three equivalent in-plane orientations of the CrO 2 unit cell as confirmed by e… Show more

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Cited by 44 publications
(48 citation statements)
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“…Nearly no surface contamination of Cr 2 O 3 is present [14,15] which was also reported by other groups [16]. Further details of the sample growth and characterization have been discussed elsewhere [17].…”
supporting
confidence: 75%
“…Nearly no surface contamination of Cr 2 O 3 is present [14,15] which was also reported by other groups [16]. Further details of the sample growth and characterization have been discussed elsewhere [17].…”
supporting
confidence: 75%
“…Growth on sapphire actually starts with Cr 2 O 3 and then changes to the required CrO 2 . 21,22 Grains are aligned at 60 • to each other with sixfold rotational symmetry of hexagonal crystal structure of underlying sapphire substrate. We earlier reported in some detail on the film growth, the morphology of the films, and also on the magnetization of the films.…”
Section: Materials and Sample Preparationmentioning
confidence: 99%
“…Characterization by X-ray diffractometry showed only CrO 2 (020) and (040) reflexes, indicating a preferred a-axis growth. Electron-diffraction analysis exhibits an artificial six-fold in-plane symmetry and a formation of twin boundaries [9]. A scanning electron microscopy (SEM) image of (010)-oriented CrO 2 crystallites on the Cr 2 O 3 (0001) initial layer is shown in Fig.…”
mentioning
confidence: 99%