2017
DOI: 10.3762/bjnano.8.194
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Growth and characterization of textured well-faceted ZnO on planar Si(100), planar Si(111), and textured Si(100) substrates for solar cell applications

Abstract: In this work, textured, well-faceted ZnO materials grown on planar Si(100), planar Si(111), and textured Si(100) substrates by low-pressure chemical vapor deposition (LPCVD) were analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and cathode luminescence (CL) measurements. The results show that ZnO grown on planar Si(100), planar Si(111), and textured Si(100) substrates favor the growth of ZnO(110) ridge-like, ZnO(002) pyramid-like, and ZnO(101) pyramidal-ti… Show more

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Cited by 12 publications
(6 citation statements)
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References 17 publications
(18 reference statements)
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“…The (111)-Cu deposited onto (002)-ZnO thin film. Both cubic Cu2O and wurtzite ZnO t ited similar atomic arrangement of interface due to low lattice mismatch 7.1% [26]. XRD patterns before and after the stacking of p-Cu2O thin film Figure 8.…”
Section: Structural Propertiesmentioning
confidence: 94%
“…The (111)-Cu deposited onto (002)-ZnO thin film. Both cubic Cu2O and wurtzite ZnO t ited similar atomic arrangement of interface due to low lattice mismatch 7.1% [26]. XRD patterns before and after the stacking of p-Cu2O thin film Figure 8.…”
Section: Structural Propertiesmentioning
confidence: 94%
“…In contrast, the (002)-orientation plane of ZnO displays a pyramid-like structure resembling a hexagonal cylinder, with or without a pyramidal tip. Regarding the (101)-orientation plane of ZnO, the polygon forms a pyramidal tip without the presence of a hexagonal cylinder [40].…”
Section: Optical Properties Of N-tio2/zno Bilayer Thin Filmmentioning
confidence: 99%
“…In most cases, the main reasons for the occurrence of internal strains are changes in the volume of the films during their formation [4], different coefficients of thermal expansion of the material of the film and substrate [5,6], as well as different lattice parameters of the film and substrate [7,8]. The magnitude and signs of mechanical deformations in the films depend on many factors that are related to the methods of applying the films to the substrate and the character of their growth.…”
Section: Introductionmentioning
confidence: 99%