2016
DOI: 10.1016/j.solener.2016.09.016
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Growth and characterization of dual ion beam sputtered Cu2ZnSn(S, Se)4 thin films for cost-effective photovoltaic application

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Cited by 33 publications
(12 citation statements)
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“…Considering the intermediate compounds, Garcia-Llamas et al [161] observed an increase in the band gap energy with the Ge/Sn ratio, because of the partial substitution of Sn by Ge, and also with the Cu content, due to a decrease in the MVB, cases following the Vegard law for quaternary compounds. Sengar et al [163] identified the same increase in the E g value with the S/(S+Se) ratio, which is also expected considering the quaternary end compounds.…”
Section: Se and Band Structure Calculations In Kesteritessupporting
confidence: 61%
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“…Considering the intermediate compounds, Garcia-Llamas et al [161] observed an increase in the band gap energy with the Ge/Sn ratio, because of the partial substitution of Sn by Ge, and also with the Cu content, due to a decrease in the MVB, cases following the Vegard law for quaternary compounds. Sengar et al [163] identified the same increase in the E g value with the S/(S+Se) ratio, which is also expected considering the quaternary end compounds.…”
Section: Se and Band Structure Calculations In Kesteritessupporting
confidence: 61%
“…A similar effect has been also pointed out by Hirate et al [156] in Cu 2 ZnSnSe 4 about the Cu Zn acceptor defect, which pushes the MVB up, while the Sn Zn donor defect decreases the MCB. [161,162] and Cu 2 ZnSn(S, Se) 4 [163] have been characterized by means of SE, in either single crystal, polycrystalline, or thin film forms, from the imaginary part of the dielectric constant. It is interesting to note here that significant efforts are being focused on the analysis of thin films through the modeling of surface roughness, secondary phases, and intermediate layers, with SE emerging as a potential characterization technique for the confirmation of their presence in the growth process [158,163,167,168].…”
Section: Se and Band Structure Calculations In Kesteritesmentioning
confidence: 99%
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“…In addition, a directcurrent coupled assist-ion source, comprising of Ar + ion plasma, is utilized to reduce columnar growth and, thereby, boost film adhesion and growth uniformity. 27 GZO thin films are deposited by the Elettrorava DIBS system, where a sapphire substrate with an area of 10 × 10 mm 2 and thickness of 0.5 mm is used to measure the transmittance, and Si (110) substrate is used to perform other characterizations. Moreover, the assist source of DIBS system is the primary source of the formation of metal and metal oxide nanoclusters.…”
Section: ■ Experimental Sectionmentioning
confidence: 99%
“…The optical properties of CZTS and CZTSe compounds have been studying extensively . There has also been a number of computational and experimental studies addressing structural, electronic, and optical properties of their mixtures, that is, CZTSSe. The highest efficiency attained so far for CZTSSe is 12.6%, which was achieved by partially substituting S anions with Se forming a band‐gap grading through the depth of the film with optical gaps ranging from 1.1 to 1.5 eV.…”
Section: Introductionmentioning
confidence: 99%