2010
DOI: 10.1016/j.diamond.2010.01.040
|View full text |Cite
|
Sign up to set email alerts
|

Growth and characterization of diamond micro and nano crystals obtained using different methane concentration in argon-rich gas mixture

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

0
4
0

Year Published

2012
2012
2021
2021

Publication Types

Select...
6

Relationship

0
6

Authors

Journals

citations
Cited by 7 publications
(4 citation statements)
references
References 29 publications
0
4
0
Order By: Relevance
“…Diamond with excellent physical and chemical properties such as hardness, great thermal conductivity, chemical inertness and higher carrier mobility is widely used in various fields and many searches carried out on its growth conditions and properties [1][2][3][4][5][6]. Pure diamond is an insulator with wide band gap of 5.5 eV.…”
Section: Introductionmentioning
confidence: 99%
“…Diamond with excellent physical and chemical properties such as hardness, great thermal conductivity, chemical inertness and higher carrier mobility is widely used in various fields and many searches carried out on its growth conditions and properties [1][2][3][4][5][6]. Pure diamond is an insulator with wide band gap of 5.5 eV.…”
Section: Introductionmentioning
confidence: 99%
“…Originally, it was suggested that the C 2 radical played an important role in the growth mechanism [6]. However, recent works have shown that the concentration of CH 3 and C 2 H are much greater than C 2 , and these species may be more important growth precursors than C 2 under typical nanocrystalline deposition conditions [30,31,52].…”
Section: The Preparation Methods Of Nanodiamond Filmsmentioning
confidence: 99%
“…This SiC formation, which usually occurs on the edge and top of the pores, can be related to high adhesion between diamond and PS 14 . The average grain size was calculated by Scherrer equation 18 , from the <111> peak. The obtained value was around 5 nm.…”
Section: Resultsmentioning
confidence: 99%
“…In addition, BDUND/PS patterns were obtained by X-ray diffraction using a high resolution Philips difractometer, X'Pert model, with the CuK α1 radiation (λ = 0.154 nm) in grazing incident mode with an incident angle of 1°. The average grain size was estimated by Scherrer equation 18 , from the broadening of X-ray <111> peak. In order to confirm the average grain size, Field Emission Gun (FEG)-SEM images were made by a TESCAN MIRA 3 microscope system.…”
Section: Methodsmentioning
confidence: 99%