2016
DOI: 10.1016/j.actamat.2016.07.042
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Grain-boundary character distribution and correlations with electrical and optoelectronic properties of CuInSe2 thin films

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Cited by 23 publications
(35 citation statements)
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“…When combining EBSD, EBIC, and CL on the same identical areas of a CuInSe 2 /CdS/ZnO stack, it was possible to study the recombination activity at a large number of twins and (random) grain boundaries . It was found that most twin boundaries do not exhibit a substantial reduction of EBIC or CL signals, as compared with those in grain interiors, and that the recombination velocities (and therefore probably also the lifetimes) which can be calculated from the EBIC and CL distributions across random grain boundaries are different for different grain boundaries.…”
Section: Spatial Variations In Lifetimementioning
confidence: 99%
“…When combining EBSD, EBIC, and CL on the same identical areas of a CuInSe 2 /CdS/ZnO stack, it was possible to study the recombination activity at a large number of twins and (random) grain boundaries . It was found that most twin boundaries do not exhibit a substantial reduction of EBIC or CL signals, as compared with those in grain interiors, and that the recombination velocities (and therefore probably also the lifetimes) which can be calculated from the EBIC and CL distributions across random grain boundaries are different for different grain boundaries.…”
Section: Spatial Variations In Lifetimementioning
confidence: 99%
“…Enhanced microscopic information can be gathered whenever several techniques are acquired on the same specimen area. Examples for such work include combination of EBSD, EBIC, and CL investigations in order to determine the recombination velocities at grain boundaries and their correlation with the characters of grain-boundary planes (Abou-Ras et al, 2016b), and the combination of EBSD and scanning probe microscopy in order to study barriers for charge carriers at grain boundaries (Baier et al, 2011). Recombination velocities and barrier heights for charge carriers at grain boundaries together exhibit important input parameters for two-dimensional device simulations, which indicate that enhanced recombination at CIGSe grain boundaries is one possible origin of the limited open-circuit voltage in the corresponding solar cells (Abou-Ras et al, 2016c).…”
Section: Microscopic Materials and Device Propertiesmentioning
confidence: 99%
“…This corresponding twin boundaries Of the type {111}||{111} are known as coherent symmetric twist Σ3 boundaries. 13,20,27,35) The misorientation peak for Σ9 boundary lies at 38.9° for (1)(2)(3)(4)(5)(6)(7)(8)(9)(10)(11)(12)(13)(14) plane along the [110] orientation. This corresponds to symmetric tilt boundaries.…”
Section: Grain Boundary Plane Distributionmentioning
confidence: 99%
“…It is well known that GBE is an effective approach to suitably tailor properties such as ductility, stress corrosion and intergranular cracking, creep and other functional properties of polycrystalline materials. [7][8][9][10][11][12][13] In this approach, the above mentioned properties can be improved by changing the grain boundary character distribution (GBCD), specially by increasing the fraction of Coincident site lattice (CSL) boundaries in the overall grain boundary character distribution. Watanabe and co-workers [14][15][16] introduced the concept of GBE in polycrystalline materials by thermo-mechanical processing.…”
Section: Introductionmentioning
confidence: 99%