2010
DOI: 10.1016/j.cplett.2010.09.060
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Get charged up: Nonlinear optical voltammetry for quantifying the thermodynamics and electrostatics of metal cations at aqueous/oxide interfaces

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Cited by 53 publications
(72 citation statements)
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“…When compared to the pristine single layer graphene, the population of defects within the defected graphene film does not appear to significantly alter the Mg(II) ion surface coverage, at least within our detection limit of 6 × 10 9 alkaline earth metal ions/ cm 2 . 56 We conclude that all three interfaces studied here have a low density of bound Mg(II) ions. A summary of the previously published results over bare fused silica 56 and the current results from the pristine and defected graphene is presented in Table 1.…”
Section: Resultsmentioning
confidence: 87%
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“…When compared to the pristine single layer graphene, the population of defects within the defected graphene film does not appear to significantly alter the Mg(II) ion surface coverage, at least within our detection limit of 6 × 10 9 alkaline earth metal ions/ cm 2 . 56 We conclude that all three interfaces studied here have a low density of bound Mg(II) ions. A summary of the previously published results over bare fused silica 56 and the current results from the pristine and defected graphene is presented in Table 1.…”
Section: Resultsmentioning
confidence: 87%
“…The initial surface charge densities determined earlier for the pristine graphene (−0.0049(8) C/m 2 ) and defected graphene (between −0.009(3) and −0.010(3) C/m 2 ) were used to help constrain the fit. As we have noted previously, 56,69 the Gouy−Chapman model assumes a symmetric (1:1 or 2:2) analyte, which does not match our system of mixed monovalent and divalent electrolytes. While an expression for relating the interfacial potential to a 2:1:1 electrolyte solution has been derived, we are prevented from using this derivation as it cannot be expressed in a closed form for substitution into eq 2.…”
Section: Resultsmentioning
confidence: 95%
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“…The strength of the second harmonic electric field, E 2ω , that is produced at charged interfaces is a function of the incident fundamental electric field, E ω , the second-order susceptibility of the interface, χ (2) , the zero-frequency electric field corresponding to the interfacial potential produced by surface charges, Φ(0), and the third-order susceptibility, χ (3) , according to123456…”
mentioning
confidence: 99%