2017
DOI: 10.1109/led.2017.2718626
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Geometry-Based Tunability Enhancement of Flexible Thin-Film Varactors

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Cited by 4 publications
(3 citation statements)
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“…6. The IGZO shows the commonly observed CV curve indicating the value of the Al2O3 capacitance at +5 V [15]. The GST CV characteristic shows the p-type transition reaching the Al2O3 capacitance value at -5 V and a frequency of 1 kHz.…”
Section: Resultsmentioning
confidence: 72%
“…6. The IGZO shows the commonly observed CV curve indicating the value of the Al2O3 capacitance at +5 V [15]. The GST CV characteristic shows the p-type transition reaching the Al2O3 capacitance value at -5 V and a frequency of 1 kHz.…”
Section: Resultsmentioning
confidence: 72%
“…Threshold voltage VT and extrinsic field-effect mobility µFE,ext were estimated at the maximum transconductance (gm), using the measured Al2O3 gate oxide capacitance (Cox = 0.21 to 0.32 μF cm -2 ) from the TMD FETs obtained in accumulation (see Supplementary Fig. S7) 32 . The 2 μm long monolayer WSe2 FET exhibits a maximum oncurrent ID = 3.5 ± 0.05 µA µm -1 (the source of the error bars is explained below) at a drain-source voltage VDS = 1 V, which is over twice larger than the highest previously reported for flexible WSe2 (using bilayer exfoliated material) 18 .…”
Section: Flexible Top-gated Field-effect Transistorsmentioning
confidence: 99%
“…As all transistors are n-channel devices, we estimate the capacitance of the Al2O3 gate dielectrics at positive bias voltage (when the channel is in accumulation) by dividing the measured capacitance (Supplementary Fig. S7) with the overlap area of the gate with the source, drain, and semiconductor channel 32 . For MoS2 FETs the extracted Cox ≈ 0.21 μF cm -2 or an equivalent oxide thickness (EOT) ~ 16.4 nm, and for WSe2 and MoSe2 FETs we obtain Cox ≈ 0.32 μF cm -2 or EOT ~ 10.8 nm.…”
Section: Mobility Gate Capacitance and Threshold Voltage Extractionmentioning
confidence: 99%