Precise manipulation of skyrmion nucleation in microscale
or nanoscale
areas of thin films is a critical issue in developing high-efficient
skyrmionic memories and logic devices. Presently, the mainstream controlling
strategies focus on the application of external stimuli to tailor
the intrinsic attributes of charge, spin, and lattice. This work reports
effective skyrmion manipulation by controllably modifying the lattice
defect through ion implantation, which is potentially compatible with
large-scale integrated circuit technology. By implanting an appropriate
dose of nitrogen ions into a Pt/Co/Ta multilayer film, the defect
density was effectively enhanced to induce an apparent modulation
of magnetic anisotropy, consequently boosting the skyrmion nucleation.
Furthermore, the local control of skyrmions in microscale areas of
the macroscopic film was realized by combining the ion implantation
with micromachining technology, demonstrating a potential application
in both binary storage and multistate storage. These findings provide
a new approach to advancing the functionalization and application
of skyrmionic devices.