2020 IEEE Energy Conversion Congress and Exposition (ECCE) 2020
DOI: 10.1109/ecce44975.2020.9235607
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Gate-Driver Integrated Junction Temperature Estimation of SiC MOSFET Modules

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Cited by 9 publications
(2 citation statements)
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“…Building a junction temperature observer that prevents over-temperature failures involves establishing the correlation between the junction temperature and the instantaneous turn-on drain current [110]. Considering the aging of SiC MOSFET modules, lifetime prediction methods can be developed to prevent unexpected failures and as a reminder for maintenance [111].…”
Section: Diagnostic Methodsmentioning
confidence: 99%
“…Building a junction temperature observer that prevents over-temperature failures involves establishing the correlation between the junction temperature and the instantaneous turn-on drain current [110]. Considering the aging of SiC MOSFET modules, lifetime prediction methods can be developed to prevent unexpected failures and as a reminder for maintenance [111].…”
Section: Diagnostic Methodsmentioning
confidence: 99%
“…Furthermore, it operates only with power modules and is not applicable for discrete devises. Another hardware approaches based on the implementation of the intelligent gate drivers were developed in [25] and [26]. They are capable of operating with discrete transistors, however, they are also at the stage of prototyping and absent in the market.…”
Section: State Of the Artmentioning
confidence: 99%