In this work, the effect of CuPt
B
ordering
on the optoelectronic
properties of Ga
0.5
In
0.5
P is studied by combining
in situ
transmission electron microscopy measurements and
density functional theory (DFT) calculations. GaInP layers were grown
by metal organic vapor phase epitaxy with a CuPt
B
single-variant-induced
ordering due to the intentional misorientation of the Ge(001) substrate.
Moreover, the degree of order was controlled using Sb as the surfactant
without changing other growth parameters. The presence of antiphase
ordered domain boundaries (APDBs) between the ordered domains is studied
as a function of the order parameter. The
in situ
electrical measurements on a set of samples with controlled degree
of order evidence a clear anisotropic electrical conductivity at the
nanoscale between the [110] and [1–10] orientations, which
is discussed in terms of the presence of APDBs as a function of the
degree of order. Additionally, DFT calculations allow to determine
the differences in the optoelectronic properties of the compound with
and without ordering through the determination of the dielectric function.
Finally, the anisotropy of the electrical conductivity for the ordered
case is also discussed in terms of the effective mass calculated from
the band structure on specific
k
-paths. By comparing
the experimental measurements and the theoretical calculations, two
factors have been presented as the main contributors of the electric
conductivity anisotropy of CuPt
B
-type ordered GaInP thin
films: antiphase boundaries that separate domains with uniform order
(APDBs) and the anisotropy of the effective mass due to the alternating
of In/Ga rich planes.