PACS: 62.20.Fe; 78.40.Fy; 78.66.Fd We have performed transmittance and piezomodulated transmittance measurements of as-grown GaAsN layers on GaAs substrates. The absorption shows energy an splitting of the ground state transition and a simultaneous increase of the splitting with the increase of the N content. This indicates the presence of a strain, which lifts the light-and heavy-hole valence band degeneracy. Surprisingly the piezomodulated transmittance shows that the heavy-hole exciton is the ground state! This implies that the GaAsN layers have a lattice parameter larger than that of GaAs and are under compression. The origin of the lattice parameter increase is the incorporation of N atoms on interstitial sites.The GaAsN and GaInNAs semiconductor alloy systems have attracted a great deal of attention due to their interesting physical properties such as an extremely large band gap bowing [1, 2]. They have a wide range of applications in solar cells [3] and optoelectronic devices [4]. The rapid development of GaInNAs-based vertical-cavity-surface-emitting lasers operating near 1.3 mm is an evidence of the great potentialities of these materials. However, several physical properties are still controversial in these materials. Recently, photoluminescence excitation (PLE) measurements on GaAsN alloy [5] have demonstrated the excitonic origin of the intrinsic ground state of GaAsN crystal. Very surprisingly no splitting of the ground intrinsic state was observed. Such a splitting should arise from the biaxial strain induced by the lattice mismatch with the GaAs substrate.The purpose of this work is the study of the optical properties of low N content layers of GaAsN by optical experiments. By performing absorption measurements we show a large splitting of the ground excitonic state of GaAsN. Differential spectroscopy allows us to identify the origin of the several features observed by absorption and gives information about the origin of the incorporation of N atoms in the host material GaAs.The samples were grown on (001) GaAs substrates in a Riber system equipped with solid sources for group-III and As elements, and with an Addon radio-frequency (rf) plasma source precursor of N. The N concentration, [N], ranges between 10 18 and 6 Â 10 19 cm --3 and the thickness of as-grown layers is of about 1 mm. All samples have been studied by transmittance (TR) and piezomodulated TR (PMTR) at low temperature ($15 K). The experimental setup of TR experiment consists of a light beam for a 100 W tungsten white light focussed on the sample. The transmitted beam is modulated by a mechanical chopper and dispersed by a 0.8 m HRS Jobin-Yvon spectrometer. For the detection we used a cooled Ge detector ($77 K) connected to a lock-in amplifier.