Effect of composite collector design on the breakdown behavior of InGaP/GaAs double heterojunction bipolar transistor J. Appl. Phys. 93, 605 (2003); 10.1063/1.1521513Analysis of collector-emitter offset voltage of InGaP/GaAs composite collector double heterojunction bipolar transistor GaInP/GaAs/GaInP double heterojunction bipolar transistors incorporating dead-space corrected composite collectors were investigated experimentally. The optimized DHBT with a 10-nm lowly doped GaAs spacer and a 5-nm highly doped GaInP spacer has extended the operating range of the collector-emitter voltage, V CE , by maximizing the collector-emitter voltage at the onset of the multiplication, V CE,onset , to 20 V, while minimizing the saturation voltage, V CE,sat ͑Ͻ1 V͒, and maintaining the nominal breakdown voltage, BV CEO , of the GaInP collector at 25 V. The design incorporating an Al 0.11 Ga 0.89 As spacer rather than a GaInP spacer within the lowly doped GaAs-GaInP composite collector demonstrated similar breakdown behavior.