1972
DOI: 10.1109/tim.1972.4314019
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Further Possibilities of the Modulated Subcarrier Technique for Microwave Attenuation Measurements in Industrial Applications

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1976
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Cited by 8 publications
(1 citation statement)
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“…This measuring technique was given by Schafer [2], Schafer and Bowman [3] and adapted for industrial applications by Kaliriski [ 4,5] and has shown particular adavantages for such measurements [6]. With the modulated subcarrier technique the A measurement can be achieved by deflection x method or by comparison method (using a standard attenuator AN …”
Section: Fundamentalsmentioning
confidence: 99%
“…This measuring technique was given by Schafer [2], Schafer and Bowman [3] and adapted for industrial applications by Kaliriski [ 4,5] and has shown particular adavantages for such measurements [6]. With the modulated subcarrier technique the A measurement can be achieved by deflection x method or by comparison method (using a standard attenuator AN …”
Section: Fundamentalsmentioning
confidence: 99%