2010
DOI: 10.1109/tim.2009.2030874
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Further Generalization of the Low-Frequency True-RMS Instrument

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Cited by 24 publications
(14 citation statements)
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“…The only requirement in this regard is that dithered base functions samples in memory are at least of 2 bits higher resolution than the resolution of the first A/D converter [11]. A block diagram of the described circuit is shown in Fig.…”
Section: Stochastic Digital Measurement Methods -Sdmmmentioning
confidence: 99%
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“…The only requirement in this regard is that dithered base functions samples in memory are at least of 2 bits higher resolution than the resolution of the first A/D converter [11]. A block diagram of the described circuit is shown in Fig.…”
Section: Stochastic Digital Measurement Methods -Sdmmmentioning
confidence: 99%
“…4 The complete derivation of formula for SDMM method measurement uncertainty is presented in [11]. For this proposal only one part of that derivation is of interest, the part dealing with measurement uncertainty of harmonics measurement using SDMM in case when input signal samples and samples of base function are of different resolution.…”
Section: Instrument Structure and Simulated Signalsmentioning
confidence: 99%
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“…Stochastic additive A/D converter with two noise generators [6] (abbreviated SAADC 2G) is oversampling measurement method. With this method, we digitally measure average value of the integral of the two analog input signals product.…”
Section: Stochastic Processor Of Orthogonal Transformsmentioning
confidence: 99%
“…In (6), k is the particular sample of Hartley Transform, yn is particular signal sample, n is counter variable and N is overall number of samples that represents signal. If sampling frequency is at least one order of magnitude higher than the frequency of measured signal, we are talking about oversampling method.…”
mentioning
confidence: 99%