2005 18th Symposium on Integrated Circuits and Systems Design 2005
DOI: 10.1109/sbcci.2005.4286828
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Fundamentals of Next Generation Compact MOSFET Models

Abstract: It has recently become clear that the electronics industry is turning away from source-referenced, threshold voltage based MOSFET models. The two main approaches as candidates to replace BSIMtype models are inversion-charge and surface-potential models. This paper provides an overview of the basic physics that must be modeled to build a compact model for the MOSFET and compares the two approaches taken by the developers of next generation models.

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Cited by 3 publications
(3 citation statements)
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“…Expanding [9], for constant V G (3), (4), in power series around an specific value of the surface potential we obtain…”
Section: Linearization Of the Inversion Charge Density Vs Surface Pot...mentioning
confidence: 99%
“…Expanding [9], for constant V G (3), (4), in power series around an specific value of the surface potential we obtain…”
Section: Linearization Of the Inversion Charge Density Vs Surface Pot...mentioning
confidence: 99%
“…There has been a great deal of discussion [1][2][3][4] about the convenience of using either surface potential-based or charge-based formulations for developing MOSFET compact models. On the other hand, it is convenient that the models be formulated in such a generalized manner that they remain valid for various device configurations and operating conditions.…”
Section: Introductionmentioning
confidence: 99%
“…This analytical approach provides better accuracy and independently lacks the device and model parameters. A physics-based analytical model [5][6][7] is a surface-inversion charge potential approach. The defined model linearizes surface-inversion charge density factors to improve accuracy with high complex equations and parameters.…”
mentioning
confidence: 99%