Functional checks of microprocessors during radiation tests

Abstract. The paper is devoted to the setup for controlling and testing of Direct Digital Synthesizer (DDS) Integrated Circuits (ICs). Control and measurement setup is designed on the basis of National Instruments module equipment PXI-4110, PXI-7841R and LabVIEW development environment. Block diagram of the developed system and software structure are depicted as well as test results for several ICs.

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“…Its task was to set the clock frequency, transmit and receive data [9][10][11][12][13][14][15][16][17][18].…”

Section: Solutionmentioning

confidence: 99%

Testing System for Analog Devices Direct Digital Synthesizer

2016

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“…The choice of the base FPGA module is a positive decision for the entire system. FPGA module allows testing of integrated circuits not only using the order card, but, as described in [12][13][14][15][16][17][18][19][20], using the approach of building an FPGA module full test environment study of ASIC's firmware.…”

Section: Implementation and Future Prospectsmentioning

confidence: 99%

NI PXI-Based Automated Measurement System for Digital ASICs Verification

et al. 2016

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Abstract. The paper describes a structure of the automated measuring system used to control digital ASICs electrical and functional parameters. The automated measuring system is based on National Instruments PXI modules. The PXI-7954R module is the most significant module in the system. Hardware and software operations of the measuring system are discussed in the paper. The measuring system is based on test vectors for digital ASICs functional verification.

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“…We review the most typical problems of multifunctional VLSI ICs TID testing which are illustrated by different ICs radiation behavior [6]- [14]. We also provide typical guidelines for FT procedure (both hardware and software) and present the proper gamma irradiation facility.…”

Section: Introductionmentioning

confidence: 99%

TID behavior of complex multifunctional VLSI devices

Kalashnikov

Nikiforov

2014

2014 29th International Conference on Microelectronics Proceedings - MIEL 2014

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Total ionizing dose (TID) radiation tests of complex multifunctional Very-large-scale integration (VLSI) integrated circuits (ICs) rise up some particularities as compared to conventional "simple" ICs. The main difficulty is to organize informative and quick functional tests directly under irradiation. Functional tests approach specified for complex multifunctional VLSI devices is presented and the basic radiation test procedure is discussed in application to some typical examples.

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Functional checks of microprocessors during radiation tests

Cited by 16 publications

References 1 publication

Testing System for Analog Devices Direct Digital Synthesizer

Testing System for Analog Devices Direct Digital Synthesizer

NI PXI-Based Automated Measurement System for Digital ASICs Verification

TID behavior of complex multifunctional VLSI devices

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