Fringe analysis in scanning frequency interferometry for absolute distance measurement

We report the influence of the nonlinearities in the wavelength-sweeping speed on the resulting interferometric signals in an absolute distance interferometer. The sweeping signal is launched in the reference and target interferometers from an external cavity laser source. The experimental results demonstrate a good resolution in spite of the presence of nonlinearities in the wavelength sweep. These nonlinearities can be modeled by a sum of sinusoids. A simulation is then implemented to analyze the influence of their parameters. It shows that a sinusoidal nonlinearity is robust enough to give a good final measurement uncertainty through a Fourier transform technique. It can be concluded that an optimal value of frequency and amplitude exists in the case of a sinusoidal nonlinearity.

show abstract

Sinusoidal nonlinearity in wavelength-sweeping interferometry

Perret

Pfeiffer

2007

Appl. Opt.

View full text Add to dashboard Cite

show abstract

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

hi@scite.ai

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Fringe analysis in scanning frequency interferometry for absolute distance measurement

Cited by 1 publication

References 5 publications

Sinusoidal nonlinearity in wavelength-sweeping interferometry

Sinusoidal nonlinearity in wavelength-sweeping interferometry

Contact Info

Product

Resources

About