“…It is important to note that there are many studies about thin films that have tried to understand 3D complex surface morphology through atomic force microscopy (AFM) measurements (Elenkova et al, 2015;Méndez et al, 2015;Sobola et al, 2017) using stereometric analysis (Ţălu et al, 2015a;Stach et al, 2015Stach et al, , 2017, fractal and multifractal geometry (Arman et al, 2015;Ţălu et al, 2014, 2015b, 2016a, 2019, and power spectral density functions (Arman et al, 2015;Gong et al, 2016). However, articles that use such analyses on other types of surfaces, such as plant leaves, are rare.…”