2011
DOI: 10.7567/jjap.50.01be03
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Fourier-Transform Infrared Absorption Spectroscopy of Chromium Nitride Thin Film

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Cited by 2 publications
(2 citation statements)
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“…Our results are slightly different from the previously published reflectance data, which show a broad phonon mode at around 52 meV [19]. The small difference in the position of the phonon mode could be attributed to the thickness, the composition, and the strain of the thin films used in the previous measurements, which affect the phonon mode position [20,26].…”
Section: A Optical Spectrum At Ambient Conditionscontrasting
confidence: 99%
“…Our results are slightly different from the previously published reflectance data, which show a broad phonon mode at around 52 meV [19]. The small difference in the position of the phonon mode could be attributed to the thickness, the composition, and the strain of the thin films used in the previous measurements, which affect the phonon mode position [20,26].…”
Section: A Optical Spectrum At Ambient Conditionscontrasting
confidence: 99%
“…Previously, CrN and Cr(N,O) thin films were synthesized by PLD 21,22) or RF reactive unbalanced magnetron sputtering [23][24][25] as hard coatings for cutting tools. Moreover, we have proposed the dissolution of third elements at the Cr sites of CrN and Cr(N,O) in order to improve the hardness of these films 26) and synthesized (Cr,Al)N, 27) Cr-Al-N-O, 28) (Cr,Mg)(N,O), 29) Cr-Zn-N-O, 30) and Cr-Si-N 31) thin films by PLD.…”
Section: Experimental Methodsmentioning
confidence: 99%