2019
DOI: 10.1103/physrevmaterials.3.084006
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Formation of graphene atop a Si adlayer on the C-face of SiC

Abstract: The structure of the SiC( 1 000 ) surface, the C-face of the {0001} SiC surfaces, is studied as a function of temperature and of pressure in a gaseous environment of disilane (Si2H6). Various surface reconstructions are observed, both with and without the presence of an overlying graphene layer (which spontaneously forms at sufficiently high temperatures). Based on cross-sectional scanning transmission electron microscopy measurements, the interface structure that forms in the presence of the graphene is found… Show more

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Cited by 4 publications
(18 citation statements)
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“…Vibrational entropy effects that modify the higher-temperature equilibria are considered in more detail in Ref. 28 . In the limit of sufficiently thick slabs, the surface energy γ of a two-dimensional periodic SiC slab with a C face and a Si face is given as…”
Section: Methodsmentioning
confidence: 99%
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“…Vibrational entropy effects that modify the higher-temperature equilibria are considered in more detail in Ref. 28 . In the limit of sufficiently thick slabs, the surface energy γ of a two-dimensional periodic SiC slab with a C face and a Si face is given as…”
Section: Methodsmentioning
confidence: 99%
“…In a very recent publication 28 , Li et al (including some of us) presented a more detailed study of surface phases occurring prior to the onset of near-equilibrium growth of graphene on the C-face of SiC without and with temperature effects and presence of hydrogen. In Ref.…”
Section: Introductionmentioning
confidence: 99%
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“…This team has pursued its search and independently proposed the same ad-layer 2DL 1 as a possible candidate for the 3×3. 18 In order to understand why the 2DL 1 silicon over-layer does not reproduce the stm g condition it is necessary to analyze the interaction of this layer with the last carbon layer. Among the nine dangling bonds in the 3×3 cell, two are passivated by the silicon ad-atoms in top position (A and B sites), six are passivated by the three bridging Si connecting (O sites), the remaining dangling bond (C site) being not passivated.…”
mentioning
confidence: 99%