Force interactions and adhesion of gold contacts using a combined atomic force microscope and transmission electron microscope

Erts, Donāts; Lõhmus, Ants; Lõhmus, Rünno; Olin, Håkan; Pokropivny, A. V.; Ryen, L.; Svensson, Krister

doi:10.1016/s0169-4332(01)00933-3

Cited by 84 publications

(61 citation statements)

References 38 publications

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“…The linear dependence on particle radius was also confirmed by Skulason and Frisbie [316] for even smaller radii using AFM tips. The force between a gold coated tip and a gold surface was measured by AFM and the shape of tip and sample as well as the size of the contact area were imaged by a transmission electron microscope [599]. The results were found to agree with the Maugis theory.…”

Section: Particle Adhesionmentioning

confidence: 59%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,187

2,949

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Section: Particle Adhesionmentioning

confidence: 59%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,187

2,949

View full text Add to dashboard Cite

“…34,35,[46][47][48][49][50][51] HRTEM enables us to observe directly the atomic configuration of ASWs. 28,[41][42][43][44][45][52][53][54][55][56][57][58][59][60][61][62][63][64][65][66][67] However, ASWs observed by HRTEM have been restricted to less than five constituent atoms owing to instability. Therefore, the atomic configuration of longer stable ASWs and the relationship to their electrical and mechanical properties still remain open problems.…”

Section: Introductionmentioning

confidence: 99%

Atomic configuration and mechanical and electrical properties of stable gold wires of single-atom width

2008

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The formation dynamics of stable gold ͑Au͒ wires of single-atom width during tensile deformation of the nanometer-sized Au contacts was observed in situ at room temperature by transmission electron microscopy. Simultaneously, force and conductance were measured using functions of scanning probe microscopy. The wires were extended to 2.7Ϯ 0.1 nm and the number of atoms was increased to 10; the average interatomic distance was 0.30Ϯ 0.02 nm. The duration of the observation of the wires exceeded 10 s. The results of the simultaneous observation of the atomic configuration, force, and conductance led to the conclusion that the stable Au wires observed in this study are complexed with light-element atoms. The constants of the mechanical properties of the individual wires, i.e., elastic limit, Young's modulus, and strength, were analyzed on the basis of stress-strain curves experimentally measured on an atomic scale. During elastic elongation, a force of 1.6Ϯ 0.7 nN acted on the Au wires with an elastic limit of 0.15-0.20. Young's modulus of single-atom-width Au wires was 47-116 GPa and strength was 8 -17 GPa, estimated using a cross-sectional area of 0.118 nm 2 , which is that of a single atom in bulk along ͗110͘. Using these mechanical constants, the average interatomic distance in stress-free wires was estimated to be 0.26Ϯ 0.02 nm. The histogram of conductances for the single-atom-width Au wires showed a peak at approximately 1G 0 ͑where G 0 =2e 2 / h, e being the charge of an electron and h Planck's constant͒ until the total number of atoms exceeds 5. For longer wires constructed of more than six atoms, the conductance decreased to less than 0.1G 0 .

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“…24,25 It was demonstrated that in situ transmission electron microscopy ͑TEM͒ had an atomistic spatial resolution for deformation of nanocontacts of metals and isolators. [27][28][29][30][31][32][33][34][35][36][37] In particular, the stress-strain relation for nanometer-sized structures was directly observed by in situ TEM combined with sub-nanoNewton force measurement systems. 33,34,37 Synthesis and electrical properties of silicon ͑Si͒ contacts and wires have been extensively studied on nanometer scales.…”

Section: Introductionmentioning

confidence: 99%

Measurements of the atomistic mechanics of single crystalline silicon wires of nanometer width

et al. 2005

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Tensile deformation behavior of silicon ͑Si͒ wires with nanometer widths, synthesized by nanometer-tip contact and successive retraction, was studied by atomistic combined microscopy of high-resolution transmission electron microscopy/scanning probe microscopy. The elastic limit, Young's modulus, and strength of individual Si nanowires were investigated based on the mechanics of materials at an atomic scale. It was found that both Young's modulus and strength increased to 18± 2 and 5.0± 0.3 GPa, respectively. The elastic limit was 0.10± 0.02 and fracture strain was estimated to be 0.30± 0.01. Experimental results show that mechanical properties of Si wires transform due to size reduction from micrometer to nanometer scale.

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Force interactions and adhesion of gold contacts using a combined atomic force microscope and transmission electron microscope

Cited by 84 publications

References 38 publications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Force measurements with the atomic force microscope: Technique, interpretation and applications

Atomic configuration and mechanical and electrical properties of stable gold wires of single-atom width

Measurements of the atomistic mechanics of single crystalline silicon wires of nanometer width

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