1988
DOI: 10.1016/0375-9601(88)90868-7
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Force dependences for the definition of the atomic force microscopy spatial resolution

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Cited by 52 publications
(11 citation statements)
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“…Mate et al [238] use the same set-up to study the thickness of liquid polymeric films [239,240]. Moiseev et al [241] measure forces with an STM-detection AFM between an Al 2 O 3 tip and an Al 2 O 3 surface. Also the first theoretical analysis of force curves is concerned with the elastic properties of the interacting surfaces [242].…”
Section: Overviewmentioning
confidence: 99%
“…Mate et al [238] use the same set-up to study the thickness of liquid polymeric films [239,240]. Moiseev et al [241] measure forces with an STM-detection AFM between an Al 2 O 3 tip and an Al 2 O 3 surface. Also the first theoretical analysis of force curves is concerned with the elastic properties of the interacting surfaces [242].…”
Section: Overviewmentioning
confidence: 99%
“…For extremely short wave lengths 10 −10 m < λ < 10 −9 m the best constraints on α G , λ were obtained in [297,298] by measuring the van der Waals force acting between a plate and a tip of an Atomic Force Microscope made of Al 2 O 3 .…”
Section: Constraints From the Experiments With Dielectric Test Bodiesmentioning
confidence: 99%
“…A simple correction method giving the possibility to extract the microscopic dispersion constants (C 6 in the law U(r) ÀC 6 /r 6 ) using the macroscopic Hamaker constants (H 1 and H 2 in the nonretarded and retarded limit, respectively) has been proposed in [116,359]. If tip and sample occupy two half spaces divided by a gap of width z, then, performing an additive summation of the pair interatomic energies, one can easily show that the total nonretarded interaction energy (per unit area) is given by Uz À pn 1 n 2 C 6 12z 2 ; 5:1…”
Section: The Van-der-waals (Vdw) Forcesmentioning
confidence: 99%
“…For other possible tip shapes the dependence F(h) G h n is characterized by different values of the power index n (namely, À3 for a cylindrical tip, À1 for a conical one, etc.). The authors of [116,367] have analysed the geometry effects in AFM in more detail. It was found that the accuracy of the additive approximation is practically not worse than 5 to 10% and no more than 25% in the worst-case situation.…”
Section: The Van-der-waals (Vdw) Forcesmentioning
confidence: 99%