1991
DOI: 10.1116/1.585279
|View full text |Cite
|
Sign up to set email alerts
|

Focused ion beam induced deposition of platinum for repair processes

Abstract: Focused ion beam induced deposition of platinum from a gas of (methylcyclopentadientyl) trimethyl platinum has been demonstrated and used for integrated circuit repair. Ga+ ions in the range of 30–40 keV have been used and line widths down to 0.3 μm with resistivities as low as 70 μΩ cm have been observed. The deposition yield as a function of angle of incidence has been measured by scanning the ion beam across a 2.6 μm diameter pyrex rod. The conductors on an actual integrated circuit have been modified by mi… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1

Citation Types

1
34
0

Year Published

1997
1997
2020
2020

Publication Types

Select...
8
1
1

Relationship

0
10

Authors

Journals

citations
Cited by 71 publications
(35 citation statements)
references
References 0 publications
1
34
0
Order By: Relevance
“…Organometallic materials are already used in the semiconductor industry to repair photolithography masks and integrated circuits using focused ion beam deposition [3] [4]. Other methods that have been reported for depositing organometallic material include direct laser writing and e-beam writing.…”
Section: Introductionmentioning
confidence: 99%
“…Organometallic materials are already used in the semiconductor industry to repair photolithography masks and integrated circuits using focused ion beam deposition [3] [4]. Other methods that have been reported for depositing organometallic material include direct laser writing and e-beam writing.…”
Section: Introductionmentioning
confidence: 99%
“…Focused Ion Beam (FIB) can offer similar benefit, but the cost is very high and deposition materials are quite limited. 9 Most useful would be a facile, low-cost e-beam patterning method for fragile or non-planar substrates, ideally still retaining the many advantages of PMMA.…”
Section: Facile Electron-beam Lithography Technique For Irregular Andmentioning
confidence: 99%
“…Applying these unique point-like sources with a brightness in the order of 10 6 Acm À2 sr À1 ion beams with a diameter less than 10 nm and current densities more than 10 Acm À2 can be achieved. So a very promising field was opened to use the FIB for mask [3] and integrated circuit repair and modification [4], failure analysis [5] or TEM specimen preparation [6], as well as in material science for sputtering investigations and applications [7,8], for the formation of quantum dots and wires [9] for the fabrication of MicroElectro-Mechanical Systems (MEMS) [10] and for a lot of other applications in micro-and nano-technology. The majority of FIB systems operating worldwide are suited only for gallium ions, due to the favoured properties, like its low melting point (T m = 29.6°C) and the simple emitted mass spectrum.…”
Section: Introductionmentioning
confidence: 99%