Focused ion beam deposition of Co₇₁Cr₁₇Pt₁₂and Ni₈₀Fe₂₀on tips for magnetic force microscopy

Abstract

We demonstrate that a focused ion beam can deposit magnetic coatings on cantilevers used for atomic force microscopy, thereby producing a sensor for magnetic force microscopy. This technique is highly versatile, allowing the convenient deposition of complex or expensive materials, such as Co71Cr17Pt12. A second material chosen for this demonstration was the permalloy (Ni80Fe20). We show magnetic images acquired with these cantilevers to illustrate their excellent properties and the differences between coatings. In principle, multilayer coatings could be easily made with this technique.

Compact variable-temperature magnetic force microscope with optical access and lateral cantilever positioning

“…This is advantageous for expensive materials such as Co 71 Cr 17 Pt 12 . 23 The cantilever chip is fixed, tip pointing upward, to a brass cantilever holder plate with silver paint or epoxy. This plate is held against the bottom of the instrument, as shown in Fig.…”

Nanomagnets with high shape anisotropy and strong crystalline anisotropy: perspectives on magnetic force microscopy

“…The ideal hard magnetic single-domain tip should be an elongated needle, which has the highest shape anisotropy [2] made out of rare-earth alloy with hard magnetic phase. State-of-the-art technologies for nanomagnet fabrication are FIB [3][4][5][6][7], STM, electrodeposition and chemical vapor deposition (CVD), among others [8][9][10][11][12][13][14][15][16]. However, most of fabricated nanomagnets are made of soft, low aspect ratio thin-film materials.…”