Fluorescence X-ray computed tomography (FXCT) using a position-sensitive CdTe detector

3D Non-Destructive Fluorescent X-Ray Computed Tomography With a CdTe Array

“…Each pixel is read out sequentially and multiplexed by an onboard ADC. Table III, the thickness of the characteristic detector was 1 mm, which was large enough to effectively absorb the energy of the characteristic X-ray [1,22]. Table IV compares the XR-100T point CdTe detector used in previous research [8] to the AJAT PID 350 2D CdTe array used in our research.…”

“…The height was 25 mm, and the area was 1  1 mm 2 ; accordingly, the grid ratio was 25:1 [1,[23][24][25]. The size of the lead collimator was 50  50 mm 2 , which covered the entire area of the characteristic X-ray detector.…”

“…in very little X-ray penetration through the thick part of the metals. That is, because the detected radiation counts penetrating through the metals are very low, the reconstructed metals showed the highest (or lowest) intensity in reconstructed images, regardless of the types of metals [1]. However, for FXCT, the detection and analysis of the characteristic X-ray reveals the atomic number of the target materials; therefore, the FXCT system distinguishes even those materials with similar densities and attenuation coefficients.…”

“…The energy difference between the orbits is then emitted in the form of an electromagnetic wave called a characteristic X-ray. If the energy of the incident X-rays is higher than the binding energy of the K-shell, a K-shell characteristic X-ray with an energy that is independent of the type and energy of the incident radiation is emitted [1] (cf. Fig.…”

Experimental Demonstration of X-Ray Fluorescence CT Using a Spatially Distributed Multi-Beam X-Ray Source

“…In order to improve the contrast of x-ray fluorescence (XRF) signals in the raw projection data, common XFCT systems use single-pixel x-ray spectrometers to record XRF photons stimulated by the pencil-beam x-ray source and achieve line-by-line scan of the whole object by translating the incident beam or the rotation stage [16][17][18][19]. Another kind of system design is to use a cone-beam source to irradiate the whole object and then use the panel detector with pinhole collimation to record the intensity and spatial information of XRF photons [20][21][22][23][24]. Compared with the linear design, the projection data obtained by the first kind of system have higher sensitivity and lower scattered background due to the highenergy resolution of the spectrometer.…”