2022
DOI: 10.1002/smll.202107540
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Flexoelectric Domain Walls Originated from Structural Phase Transition in Epitaxial BiVO4 Films

Abstract: Polar domain walls in centrosymmetric ferroelastics induce inhomogeneity that is the origin of advantageous multifunctionality. In particular, polar domain walls promote charge‐carrier separation and hence are promising for energy conversion applications that overcome the hurdles of the rate‐limiting step in the traditional photoelectrochemical water splitting processes. Yet, while macroscopic studies investigate the materials at the device scale, the origin of this phenomenon in general and the emergence of p… Show more

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Cited by 11 publications
(6 citation statements)
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“…Clear bright and dark contrasts associated with polarized ferroelectric domain structures can be seen in the phase and amplitude images. Compared to C300, C500 exhibits a contrast which is more pronounced, indicating a multidomain-like structure with a larger extent of surface polarization. ,, …”
Section: Resultsmentioning
confidence: 98%
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“…Clear bright and dark contrasts associated with polarized ferroelectric domain structures can be seen in the phase and amplitude images. Compared to C300, C500 exhibits a contrast which is more pronounced, indicating a multidomain-like structure with a larger extent of surface polarization. ,, …”
Section: Resultsmentioning
confidence: 98%
“…Compared to C300, C500 exhibits a contrast which is more pronounced, indicating a multidomain-like structure with a larger extent of surface polarization. 13,18,19 Figure S5a displays the Kubelka−Munk absorption plot of the samples derived from their diffuse reflectance spectroscopy (DRS) spectra. The 467 nm peak undergoes a spectral redshift in the calcined samples, showing that the monoclinic scheelite system experiences a change in its electronic structure.…”
Section: Resultsmentioning
confidence: 99%
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“…Focusing on the field of thin film ceramics, this is not so different. Methods such as grinding and polishing [13][14][15] or dimple grinding [16,17] followed by energy ion milling or focused ion beam (FIB) [18,19] are well established when working with such materials, being able to achieve thin samples suitable for atomic resolution investigations. Because the volume of interest is reduced when studying thin films (in comparisons with their bulk counterparts), more accuracy and skill are needed to prepare the sample, even more so for cross-sectional analysis compared to plane view investigations.…”
Section: Introductionmentioning
confidence: 99%