FLAW: FPGA lifetime awareness

Srinivasan, Suresh; Sarpatwari, K.; Mangalagiri, Prasanth

doi:10.1109/dac.2006.229305

Cited by 18 publications

(14 citation statements)

References 8 publications

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“…In addition, relocatable bit stream technology has also been proposed [9]. Aging failure is also known as aging fault [10], and the test used for initial faults can be applied to stuck-at-faults caused by aging. For NBTI, other methods have been proposed [11].…”

Section: Related Workmentioning

confidence: 99%

Physical Fault Detection and Recovery Methods for System-LSI Loaded FPGA-IP Core

Amagasaki

Nishitani

Inoue

et al. 2017

IEICE Trans. Inf. & Syst.

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SUMMARYFault tolerance is an important feature for the system LSIs used in reliability-critical systems. Although redundancy techniques are generally used to provide fault tolerance, these techniques have significantly hardware costs. However, FPGAs can easily provide high reliability due to their reconfiguration ability. Even if faults occur, the implemented circuit can perform correctly by reconfiguring to a fault-free region of the FPGA. In this paper, we examine an FPGA-IP core loaded in SoC and introduce a fault-tolerant technology based on fault detection and recovery as a CAD-level approach. To detect fault position, we add a route to the manufacturing test method proposed in earlier research and identify fault areas. Furthermore, we perform fault recovery at the logic tile and multiplexer levels using reconfiguration. The evaluation results for the FPGA-IP core loaded in the system LSI demonstrate that it was able to completely identify and avoid fault areas relative to the faults in the routing area.

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Section: Related Workmentioning

confidence: 99%

Physical Fault Detection and Recovery Methods for System-LSI Loaded FPGA-IP Core

Amagasaki

Nishitani

Inoue

et al. 2017

IEICE Trans. Inf. & Syst.

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“…There can be various kinds of faults that can occur in an FPGA-based system: • Aging faults: These types of faults are caused due to the degradation of the components, which can be attributed to a number of mechanisms [3].…”

Section: Need For Ft For Fpgasmentioning

confidence: 99%

A Novel Approach for Providing Fault Tolerance to FPGA-Based Reconfigurable Systems

Sharma¹,

Chakraverty²

2012

IJET

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Abstract-Thedynamically reconfigurable Field Programmable Gate Arrays (FPGAs) are most frequently employed for developing adaptive embedded systems. They are also being increasingly used as co-processors in high performance computing applications. For these systems to be fielded in harsh environments such as those encountered in space, extra-terrestrial locations and regions of extreme conditions on the earth, one must adopt fault tolerant design techniques to ensure uninterrupted and reliable operation despite the occurrence of faults. Commercial Off-the-Shelf (COTS) FPGA components offer a cost effective design trajectory where the designer can choose among a rich variety of FT approaches and techniques. This paper compares the various FT techniques and proposes a novel method in which these techniques can work together to provide a synergetic approach for fault tolerant FPGA design.

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“…Causes of degradation Degradation in VLSI circuits can be attributed to a number of mechanisms [2]. The hot-carrier effect leads to a build up of trapped charges in the gate-channel interface region [3].…”

Section: 1mentioning

confidence: 99%

Fault tolerant methods for reliability in FPGAs

Stott

Sedcole

Cheung

2008

2008 International Conference on Field Programmable Logic and Applications

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Reliability and process variability are serious issues for FPGAs in the future. Fortunately FPGAs have the ability to reconfigure in the field and at runtime, thus providing opportunities to overcome some of these issues. This paper provides the first comprehensive survey of fault detection methods and fault tolerance schemes specifically for FPGAs, with the goal of laying a strong foundation for future research in this field. All methods and schemes are qualitatively compared and some particularly promising approaches highlighted.

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FLAW: FPGA lifetime awareness

Cited by 18 publications

References 8 publications

Physical Fault Detection and Recovery Methods for System-LSI Loaded FPGA-IP Core

Physical Fault Detection and Recovery Methods for System-LSI Loaded FPGA-IP Core

A Novel Approach for Providing Fault Tolerance to FPGA-Based Reconfigurable Systems

Fault tolerant methods for reliability in FPGAs

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