“…However, a B-scan usually consists of hundreds of A-scans which further aggravates the problem of lack of data. Developed algorithms for defect detection can be divided into three groups related to data representation being used; A-scans [14,15,16,17,18,19,20,7,21,22,8,23], B-scans [24,25,6,5] and C-scans [26,27]. The A-scan analysis is the most researched group of all which is also related to the data problem.…”