2011
DOI: 10.1016/j.nimb.2011.02.036
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First results obtained using the CENBG nanobeam line: Performances and applications

Abstract: Keywords: Ion nanobeam uclear microprobe Magnetic quadrupoles Ion beam optics Ion beam analysisA high resolution focused beam line has been recently installed on the AIFIRA ("Applications Interdisciplinaires des Faisceaux d'lons en Region Aquitaine") facility at CENBG. This nanobeam line, based on a doublet-triplet configuration of Oxford Microbeam Ltd. OM-50™ quadrupoles, offers the opportunity to focus protons, deuterons and alpha particles in the MeV energy range to a sub-micrometer beam spot. The beam opti… Show more

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Cited by 30 publications
(12 citation statements)
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“…In particular, this facility is equipped with a nanobeam line in a doublet-triplet magnetic configuration allowing sub-micrometre lateral resolution under vacuum [9], which is routinely used for PIXE analysis [10,11].…”
Section: Measurement Of Fluorescence Spectra On the Aifira Nanobeam Linementioning
confidence: 99%
“…In particular, this facility is equipped with a nanobeam line in a doublet-triplet magnetic configuration allowing sub-micrometre lateral resolution under vacuum [9], which is routinely used for PIXE analysis [10,11].…”
Section: Measurement Of Fluorescence Spectra On the Aifira Nanobeam Linementioning
confidence: 99%
“…The μ-STIM microscopy also reveals all the local changes in the cell density ( Figure 1e) and cell structures such as the nucleus, nucleolus, and cytoplasm. 45 The particle-induced secondary electron microscopy (PISEM) provides a surface image of the cells (Figure 1). The resolution is lower than that obtained with high-resolution conventional SEM (using electrons) but reveals the integrity of the analyzed cells and the presence of dense aggregates of TRITC-TiO 2 NPs adsorbed on the cell surface (white dots pointed by arrows).…”
mentioning
confidence: 99%
“…Particle-induced X-ray emission (PIXE) technique has a good sensitivity at the micron scale and even at sub-micron resolution, as recently demonstrated (Barberet et al, 2011). It is a fully quantitative method when coupled to Rutherford backscattering spectrometry but suffers from radiation-induced effects and a limited sensitivity compared to synchrotron XRF microscopy.…”
Section: Discussionmentioning
confidence: 99%