2016
DOI: 10.1088/1674-1056/25/5/057103
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First-principles study of strain effect on the formation and electronic structures of oxygen vacancy in SrFeO 2

Abstract: Motivated by recent experimental observations of metallic conduction in the quasi-two-dimensional SrFeO 2 , we study the epitaxial strain effect on the formation and electronic structures of oxygen vacancy (V o ) by first-principles calculations. The bulk SrFeO 2 is found to have the G-type antiferromagnetic ordering (G-AFM) at zero strain, which agrees with the experiment. Under compressive strain the bulk SrFeO 2 keeps the G-AFM and has the trend of Mott insulator-metal transition. Different from most of the… Show more

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Cited by 2 publications
(2 citation statements)
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“…The increasing magnetization at ∼ 17 K may be linked to the transition from low-spin (S = 1/2) to high-spin (S = 5/2) state of Fe 3+ . [22,23] The volume change of Fe 3+ gives rise to the conflict of atomic Hund rules due to the changed crystal field and results in a further enhancement of the total moment (see the insets of Fig. 3).…”
Section: Resultsmentioning
confidence: 99%
“…The increasing magnetization at ∼ 17 K may be linked to the transition from low-spin (S = 1/2) to high-spin (S = 5/2) state of Fe 3+ . [22,23] The volume change of Fe 3+ gives rise to the conflict of atomic Hund rules due to the changed crystal field and results in a further enhancement of the total moment (see the insets of Fig. 3).…”
Section: Resultsmentioning
confidence: 99%
“…A wide range of theoretical and experimental reports, available in the literature, depict huge motivations to explore interesting materials for versatile device functionalities. [1][2][3][4][5][6][7][8][9][10] The semiconductors belonging to II-VI, III-VI, IV-VI, are extensively being explored for various applications. Particularly, the II-VI based DMSs, for example ZnS, ZnSe, and ZnTe, are considered to be attractive owing to their wide direct band gaps, which can offer versatile opto-electronic characteristics, therefore, could be expected to replace the existing siliconbased devices.…”
Section: Introductionmentioning
confidence: 99%