It is impossible to directly measure the photoelectron spectrum of an atom using conventional XPS due to its low detection sensitivity. In this work, an indirect method has been developed to determine the binding energy (BE) of an atom. In this method, the BE of the atom can be obtained by extrapolation of the experimental BE curves with atomic deposition coverage to zero coverage. With this method, the Ni 2p 3/2 BE's of atomic Ni on TiO 2 (001) and (110)