2016
DOI: 10.1109/led.2016.2542921
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First Power Performance Demonstration of Flexible AlGaN/GaN High Electron Mobility Transistor

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Cited by 27 publications
(27 citation statements)
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“…[1][2][3] Over the last decade, gallium nitride (GaN) devices have been fundamental and essential elements to meet these requirements for high-power amplification of the radio frequency (RF) signal in MHz to GHz frequencies and beyond, especially for military applications. [16][17][18][19][20][21] Growth of GaN on Si simplifies the substrate etching removal process and has hence been the most widely used approach for development of transferred GaN electronics. [16][17][18][19][20][21] Growth of GaN on Si simplifies the substrate etching removal process and has hence been the most widely used approach for development of transferred GaN electronics.…”
Section: Flexible Gallium Nitridementioning
confidence: 99%
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“…[1][2][3] Over the last decade, gallium nitride (GaN) devices have been fundamental and essential elements to meet these requirements for high-power amplification of the radio frequency (RF) signal in MHz to GHz frequencies and beyond, especially for military applications. [16][17][18][19][20][21] Growth of GaN on Si simplifies the substrate etching removal process and has hence been the most widely used approach for development of transferred GaN electronics. [16][17][18][19][20][21] Growth of GaN on Si simplifies the substrate etching removal process and has hence been the most widely used approach for development of transferred GaN electronics.…”
Section: Flexible Gallium Nitridementioning
confidence: 99%
“…[43][44][45] The second indication of the physical impact on the DC performance is the shift in the threshold voltage (V TH ) of −0.03 and −0.17 V under the influence of 0.21% and 0.43% strain, respectively, which is related to the polarization-induced charge density increasing under applied tensile strain. [18] Higher RF performance is presumably achieved as a result of the high-quality epitaxial layer transfer enabled by GaN growth on van der Waals 2D substrates rather than Si. [38] The piezoelectric coefficient of AlGaN is greater than GaN, causing a net increase in the charge carrier density at the interface with tensile strain.…”
Section: Flexible Gallium Nitridementioning
confidence: 99%
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