IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004.
DOI: 10.1109/iedm.2004.1419218
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First demonstration of sub-0.25μm-width emitter InP-DHBTs with <400 GHz f/sub t/ and <400 GHz f/sub max/

Abstract: We report performance of sub-0.25pm emitter-width InPflnGaAsilnP DHBTs. These are the smallest emitterwidth Ill-V devices reported to date. Measured ft'fmax performance of 406GHd423GHz is the first ever reported for a sub-0.25pm emitter-width DHBT and among the fastest for any DHBTs. With the peakf; and fmw. performance occurring at I, = 8mA (Vch-1.2Sv), this is the lowest power consumption DHBT ever reported with state of the art cutoff frequencies. The as-patterned emitter contact metal width for these devic… Show more

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Cited by 12 publications
(7 citation statements)
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“…InP [37] high-electron mobility transistors (HEMTs), but still inferior to reports on SiGe [20] and InP/InGaAs [11,15,43] heterojunction bipolar transistors (HBTs). On the other hand, in MOS technology, f max , which can be shown to be proportional to the gate width, W, generally lags behind f T , as illustrated in Figure 2b.…”
Section: ϫ2mentioning
confidence: 91%
“…InP [37] high-electron mobility transistors (HEMTs), but still inferior to reports on SiGe [20] and InP/InGaAs [11,15,43] heterojunction bipolar transistors (HBTs). On the other hand, in MOS technology, f max , which can be shown to be proportional to the gate width, W, generally lags behind f T , as illustrated in Figure 2b.…”
Section: ϫ2mentioning
confidence: 91%
“…In contrast to most recent reports [9], [18], [19], based on aggressively scaled HBT technologies, our fabrication process uses only standard manufacturing techniques, including i-line stepper lithography and selective dry/wet etching [20]. Briefly, the fabrication process relies on self-aligned baseemitter contacts and benzocyclobutene (BCB) for device passivation and planarization.…”
Section: Voltage Controlled Oscillatormentioning
confidence: 99%
“…In contrast to most recent reports [4,8,9], based on aggressively scaled technologies (less than 0.5 µm), our fabrication process still relies only on standard manufacturing techniques, including i-line stepper lithography and selective dry/wet etching. A detailed description of the device and IC manufacturing technology was reported in [10].…”
Section: Introductionmentioning
confidence: 95%