Finite element simulation analysis of influencing factors in near field eddy current testing

Zhang, Wei; Li, Yanjun; Shi, Yibing; Siwei, Xiao; Li, Zhipeng

doi:10.1109/icemi46757.2019.9101695

2019 14th IEEE International Conference on Electronic Measurement &Amp; Instruments (ICEMI) 2019

DOI: 10.1109/icemi46757.2019.9101695

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Finite element simulation analysis of influencing factors in near field eddy current testing

Wei Zhang

Yanjun Li

Yibing Shi

et al.

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Finite element simulation analysis of influencing factors in near field eddy current testing

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