1987
DOI: 10.1016/0022-0248(87)90160-6
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Finite element analysis of the interface shape in the growth of RAD silicon ribbons

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Cited by 4 publications
(8 citation statements)
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“…Actual silicon with melting temperature of 1685 K was used, with a carbon ribbon pulled at a speed of 7-10 cm/min. Experimental data for only the resulting layer thickness and the relative concentrations of some impurities are reported, although additional data from finite analyses are also included in Hamidi and Belouet [7]. The similarity between vertical and horizontal pulling is that a thin film is formed from a melt liquid, with heat dissipation from the sides.…”
Section: Resultsmentioning
confidence: 97%
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“…Actual silicon with melting temperature of 1685 K was used, with a carbon ribbon pulled at a speed of 7-10 cm/min. Experimental data for only the resulting layer thickness and the relative concentrations of some impurities are reported, although additional data from finite analyses are also included in Hamidi and Belouet [7]. The similarity between vertical and horizontal pulling is that a thin film is formed from a melt liquid, with heat dissipation from the sides.…”
Section: Resultsmentioning
confidence: 97%
“…There is, however, a limited data set on the layer thickness during crystallization of silicon films on both front and back surfaces of a carbon ribbon which is pulled vertically upward through silicon melt [7]. Actual silicon with melting temperature of 1685 K was used, with a carbon ribbon pulled at a speed of 7-10 cm/min.…”
Section: Resultsmentioning
confidence: 99%
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