“…State-of-the-art research fields such as projection optics for Extreme Ultraviolet Lithography (EUVL) (Otaki et al, 2002a;Stulen & Sweeney, 1999;Goldberg et al, 2004), focusing optics for X-ray microscope (Yamamura & Takai, 2008;Handa et al, 2008;Yumoto et al, 2008;Matsuyama et al, 2008), and Michelson interferometers for detection of gravitational waves (Ando et al, 2001;Sato et al, 1999) require ultra precise mirrors with large surface areas and extremely low surface figure error (in the sub-nanometer scale). In EUVL, a light wave of 13.5 nm is used for photoresist exposure, and such an optical system accepts reflection optics instead of refractive optics owing to the short wavelength.…”