1995
DOI: 10.1063/1.114103
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Field dependent permittivity in metal-semiconducting SrTiO3 Schottky diodes

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Cited by 51 publications
(38 citation statements)
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“…For electric fields larger than 100 kV/cm, ⑀ r decreases from 350 to about 20 at 10 4 kV/cm. The field dependence of ⑀ r is similar to that observed for the Hg/STNO diodes reported by Berg et al 28 As shown in Fig. 6, we found that the field dependence of the permittivity of our junctions can be expressed as…”
Section: ͑4͒supporting
confidence: 88%
See 1 more Smart Citation
“…For electric fields larger than 100 kV/cm, ⑀ r decreases from 350 to about 20 at 10 4 kV/cm. The field dependence of ⑀ r is similar to that observed for the Hg/STNO diodes reported by Berg et al 28 As shown in Fig. 6, we found that the field dependence of the permittivity of our junctions can be expressed as…”
Section: ͑4͒supporting
confidence: 88%
“…͑4͒, we can see that this anomalous behavior of 1/C 2 ϪV a characteristics originates in the distribution of either donor concentration or permittivity as a function of depth. There have been several reports on the electric field dependence of permittivity of oxide-perovskite materials, [25][26][27][28] which dependence was expressed using a polarization saturation by Kahng et al 26 This field dependence gives rise to the modification of the C -V characteristics of a Schottky diode. In this study, supposing for simplification that donor distribution in the depletion layer is uniform, we analyzed the C -V characteristics with the model that took into account the field dependence of permittivity.…”
Section: ͑4͒mentioning
confidence: 99%
“…Using qualitative textbook arguments one expects a decrease of the space charge region with decreasing dielectric constant and increasing charge carrier concentration. The dielectric constant of SrTiO 3 strongly decreases with increasing electric field [24]. From this and the charge carrier densities given in Table I, in a band-bending scenario, the interface thickness should decrease with the number of LAO overlayers, wheras the opposite trend is observed (Table I).…”
mentioning
confidence: 80%
“…28 It has also been shown previously that under a high electric field of the order of 10 7 -10 8 V/m, like that expected in the space-charge region close to the interface with LCMO, the permittivity can be much lower, and although the temperature dependence of ε r under such high electric fields is not well established, it has been reported that it still shows a slight increase when the temperature decreases. 29 Thus we have fitted E 0 in Fig. 4 at each temperature by using Eq.…”
Section: Resultsmentioning
confidence: 99%