2015
DOI: 10.1088/0022-3727/49/4/045001
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Ferromagnetic resonance and magnetic damping in C-doped Mn5Ge3

Abstract: Abstract. Ferromagnetic resonance (FMR) was used to investigate the static and dynamic magnetic properties of carbon-doped Mn 5 Ge 3 (C 0.1 and C 0.2 ) thin films grown on Ge(111). The temperature dependence of magnetic anisotropy shows an increased perpendicular magneto-crystalline contribution at 80K with an in-plane easy axis due to the large shape contribution. We find that our samples show a small FMR linewidth (corresponding to an intrinsic magnetic damping parameter α=0.005), which is a measure of the s… Show more

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Cited by 15 publications
(13 citation statements)
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“…Hr depends on the ferromagnetic layer T c . For example, Hr ~ 2.3 kOe was shown to correspond to T c = 315  10 K for the epitaxial MBE-mediated Mn 5 Ge 3 layer [14]. This is in agreement with the expected T c ~ 297 K of the Mn 5 Ge 3 compound, as well as with our MFM measurements ( fig.…”
supporting
confidence: 90%
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“…Hr depends on the ferromagnetic layer T c . For example, Hr ~ 2.3 kOe was shown to correspond to T c = 315  10 K for the epitaxial MBE-mediated Mn 5 Ge 3 layer [14]. This is in agreement with the expected T c ~ 297 K of the Mn 5 Ge 3 compound, as well as with our MFM measurements ( fig.…”
supporting
confidence: 90%
“…and Hr  ~ 8.6 kOe) for x = 0.2 corresponds to T c = 450  30 K [14]. Hr // ~ 2.0, Hr  ~ 7.5, and Hr ~ 5.5 kOe in the polycrystalline Mn 5 Ge 3 layer obtained by NDR ( fig.…”
mentioning
confidence: 86%
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“…In addition, in the pristine sample, there exists a sixfold inplane anisotropy, present also in residual form in the C-doped film. This sixfold in-plane anisotropy was macroscopically observed in the FM resonance experiment [25]. A direct carbon impact on magnetocrystalline anisotropy leads also to a strong modification of the crystal field, evidenced in our experiment by the vanishing quadrupolar splitting of the NMR line from the Mn I site.…”
Section: Discussionsupporting
confidence: 78%
“…The Mn 5 Ge 3 C 0.6 thin films growth on Ge(111) was performed using the RDE method at room temperature. This method has been described and characterised elsewhere and involves the co-deposition of Ge, Mn and C atoms on Ge(111) surface at room temperature [25,26]. It ensures a very high crystalline quality of the Mn 5 Ge 3 C x thin films and a sample A sample B Figure 1.…”
Section: Experimental Details Devices Fabrication and Characterisationmentioning
confidence: 99%