2012
DOI: 10.1063/1.3676202
|View full text |Cite
|
Sign up to set email alerts
|

Ferromagnetic InMnSb multi-phase films study by aberration-corrected (scanning) transmission electron microscopy

Abstract: In this work we report a structural and compositional study of ferromagnetic In0.78Mn0.22Sb films correlated to the magnetic properties as determined by superconducting quantum interference device magnetometer. The epilayers grown by metalorganic vapor phase epitaxy on GaAs(001) substrates showed two active magnetic components with Curie temperatures of approximately 300 K and in excess of 570 K. Secondary phases driven by the high manganese concentration (10 at. %) were identified by high-resolution (scanning… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
18
0

Year Published

2013
2013
2018
2018

Publication Types

Select...
9
1

Relationship

3
7

Authors

Journals

citations
Cited by 32 publications
(18 citation statements)
references
References 11 publications
0
18
0
Order By: Relevance
“…Cross-sectional transmission electron microscopy (TEM) samples were prepared by conventional methods that include mechanical thinning and finishing with Ar ion milling, 18 as well as by focused ion beam methods using the FEI Nova 200 NanoLab. Selected Area electron Diffraction (SAD) was performed using TEM (JEOL 2011), while the SAD simulations were performed using CrystalKit software.…”
mentioning
confidence: 99%
“…Cross-sectional transmission electron microscopy (TEM) samples were prepared by conventional methods that include mechanical thinning and finishing with Ar ion milling, 18 as well as by focused ion beam methods using the FEI Nova 200 NanoLab. Selected Area electron Diffraction (SAD) was performed using TEM (JEOL 2011), while the SAD simulations were performed using CrystalKit software.…”
mentioning
confidence: 99%
“…Cross-sectional TEM specimens were prepared using conventional methods that include mechanical thinning and polishing followed by Ar ion milling in order to achieve electron transparency. 30 The in-plane magnetic hysteresis (M-H) loops were measured using a Vector Magnetometer Model 10 VSM and Vector measurement system. As a strong uniaxial anisotropy field (H k ) as large as 270 Oe was expected, 26 the VSM measurement was conducted using a maximum magnetic field of 400 Oe to ensure the samples were fully saturated.…”
mentioning
confidence: 99%
“…They demonstrate ferromagnetism and spin-depended scattering above the room temperature. An influence of the ferromagnetic MnSb inclusions on magnetic and electrical properties of InSb/MnSb nanostructures was observed both in bulk [15][16][17] and in films [18,19].…”
Section: Introductionmentioning
confidence: 93%