2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT) 2011
DOI: 10.1109/impact.2011.6117292
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Fault-tolerant mesh for 3D network on chip

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Cited by 7 publications
(1 citation statement)
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“…9,10 Additionally, TSV manufacturing processes have high defect rates which result in poor yields. 11,12 Also TSV pads required for bonding consume a considerable amount of area in each layer of the 3D chip. 13 However, most of the work on 3D NoCs in literature assumes full vertical connectivity.…”
Section: Introductionmentioning
confidence: 99%
“…9,10 Additionally, TSV manufacturing processes have high defect rates which result in poor yields. 11,12 Also TSV pads required for bonding consume a considerable amount of area in each layer of the 3D chip. 13 However, most of the work on 3D NoCs in literature assumes full vertical connectivity.…”
Section: Introductionmentioning
confidence: 99%