Fault diagnosis of photovoltaic modules using AC impedance spectroscopy

Osawa, Suguru; Nakano, Takuma; Matsumoto, Shusaku; Katayama, Noboru; Saka, Yusuke; Sato, Hisako

doi:10.1109/icrera.2016.7884539

Cited by 17 publications

(6 citation statements)

References 12 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…As a potential electrical signature for cell cracks, it has been reported that the intensity of the parallel resistance ( R p : cf. Fig 5A-1 ) in the AC equivalent circuit of a PV cell/module is reduced by cell cracks that are intentionally introduced in the PV cell/module [ 33 – 35 ]. We then examined whether this parameter could be crucial for cell cracks (particularly, MC cells).…”

Section: Resultsmentioning

confidence: 99%

“…Moreover, using this approach, the AC impedance parameters in the p–n junction can be independently extracted from those in the p–p + junction placed at the interface between the Si bulk (p) and rear Al-BSF (p + ) [ 50 ]. The evolution of electrical signatures caused by cell cracks has been evaluated by AC impedance spectroscopy analysis [ 33 – 35 ]; however, because AC impedance parameters ( C p / R p / R s in the AC equivalent circuit, cf. Fig 5A-1 ) were extracted from the AC impedance spectra obtained under DC biasless conditions, it has been advocated that the drastic reduction of R p might correlate with the extent of the cracks.…”

Section: Discussionmentioning

confidence: 99%

See 1 more Smart Citation

Solar cell cracks within a photovoltaic module: Characterization by AC impedance spectroscopy

Tanahashi

Hsu²

2022

PLoS ONE

View full text Add to dashboard Cite

Various cell crack modes (with or without electrically inactive cell areas) can be induced in crystalline silicon photovoltaic (PV) cells within a PV module through natural thermomechanical stressors such as strong winds, heavy snow, and large hailstones. Although degradation in the performance of PV modules by cell cracks has been reported occasionally, the mode-dependent evolutions in the electrical signatures of cracks have not yet been elucidated. In this study, we propose that the reduction of the time constant in the AC impedance spectra, which is caused by the elevation of minority-carrier recombination in the p–n junction of a PV cell, is a ubiquitous signature of cracked PV cells encapsulated in a commercially available PV module. Several other characteristics derived from the illuminated current-voltage (I–V) and dark I–V data significantly evolved only in PV cells with inactive cell areas. We also propose that the evaluation by carrier recombination is a crucial diagnostic technique for detecting all crack modes, including microcracks, in wafer-based PV modules.

show abstract

Section: Resultsmentioning

confidence: 99%

Section: Discussionmentioning

confidence: 99%

Solar cell cracks within a photovoltaic module: Characterization by AC impedance spectroscopy

Tanahashi

Hsu²

2022

PLoS ONE

View full text Add to dashboard Cite

show abstract

“…For the above reason in this study, the EIS is used to determine accurate and consistent degradation rates. This method is widely used to evaluate electrochemical devices, as well as a diagnostic tool for PV modules (Osawa et al, 2016). This method adds a small AC voltage at a certain frequency ranges onto the DC voltage of the PV module which produces an AC current response at the same frequency.…”

Section: Degradation In Pv Modulesmentioning

confidence: 99%

Performance of Photovoltaic Modules After an Accelerated Thermal Cycling Degradation Test

et al. 2019

View full text Add to dashboard Cite

Typically, datasheets of photovoltaic (PV) modules state that the guaranteed power production remains constant for a certain period of time and after this point, a linear reduction begins reaching an estimated 80% of the original rated power. Moreover, literature reports that the degradation of PV modules reaches less than 1% per year. In this regard, after 20 years of operation a typical PV module will deliver approximately 20% less energy than a the beginning of its life. In this article, the results of an accelerated thermal cycling degradation test are compared to its brand new conditions. These results demonstrate that although the performance among the PV modules is variable when new, after the cycling test the performance of the degraded PV modules is similar. In this case, the power reduction of the degraded module varies from 1.4% up o 7.6% when compared to the initial condition. Furthermore, an Electrochemical Impedance Spectroscopy (EIS) analysis demonstrates that at high frequencies the results are practically the same regardless if the panel is new or degraded, but at low frequencies the variation of the impedance is notorious.

show abstract

“…Currently, several methods are available for assessing PV modules and enabling the detection of failures and the estimation of their degradation over time [ 15 , 16 , 17 , 18 , 19 , 20 ]. Some of these methods developed in [ 21 ], such as visual inspection, infrared thermography, I-V curve tracing, and electroluminescence (EL), have already been applied in a real 2.85 MW PV plant to detect failures, assess its operational status, and estimate its overall degradation [ 22 ].…”

Section: Introductionmentioning

confidence: 99%

Methodology for Calculating the Damaged Surface and Its Relationship with Power Loss in Photovoltaic Modules by Electroluminescence Inspection for Corrective Maintenance

Saborido-Barba,

García-López,

Clavijo-Blanco

et al. 2024

Sensors

View full text Add to dashboard Cite

Photovoltaic panels are exposed to various external factors that can cause damage, with the formation of cracks in the photovoltaic cells being one of the most recurrent issues affecting their production capacity. Electroluminescence (EL) tests are employed to detect these cracks. In this study, a methodology developed according to the IEC TS 60904-13 standard is presented, allowing for the calculation of the percentage of type C cracks in a PV panel and subsequently estimating the associated power loss. To validate the methodology, it was applied to a polycrystalline silicon module subjected to incremental damage through multiple impacts on its rear surface. After each impact, electroluminescence images and I-V curves were obtained and used to verify power loss estimates. More accurate estimates were achieved by assessing cracks at the PV cell level rather than by substring or considering the entire module. In this context, cell-level analysis becomes indispensable, as the most damaged cell significantly influences the performance of the photovoltaic model. Subsequently, the developed methodology was applied to evaluate the conditions of four photovoltaic panels that had been in operation, exemplifying its application in maintenance tasks. The results assisted in decision making regarding whether to replace or continue using the panels.

show abstract

Fault diagnosis of photovoltaic modules using AC impedance spectroscopy

Cited by 17 publications

References 12 publications

Solar cell cracks within a photovoltaic module: Characterization by AC impedance spectroscopy

Solar cell cracks within a photovoltaic module: Characterization by AC impedance spectroscopy

Performance of Photovoltaic Modules After an Accelerated Thermal Cycling Degradation Test

Methodology for Calculating the Damaged Surface and Its Relationship with Power Loss in Photovoltaic Modules by Electroluminescence Inspection for Corrective Maintenance

Contact Info

Product

Resources

About